Electron Beam-Induced Sample Contamination in the SEM
نویسندگان
چکیده
منابع مشابه
TEM sample preparation of a SEM cross section using electron beam induced deposition of carbon
Article history: Received 25 May 2015 Received in revised form 3 July 2015 Accepted 6 July 2015 Available online xxxx
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ژورنال
عنوان ژورنال: Microscopy and Microanalysis
سال: 2005
ISSN: 1431-9276,1435-8115
DOI: 10.1017/s1431927605507785